线扫2波段 棱镜分光相机BVC3220LM
BVC3220 is a SWIR line scan camera which has own designed optical prism, 2 InGaAs line sensors inside and two different bandwidths of SWIR image output port.
This 2 image output data bench mark is very much beneficial for contaminant inspection in the objects as it has obvious output difference by different SWIR wavelength lighting such as reflection, transmission and absorption. It is known that each material ingredient has its unique spectroscopic response for light absorption by some specific wavelength of light beam within SWIR bandwidth. By using that response, BVC3220LM is able to provide perfect solutions for defect inspection and contaminant inspection that is hard to be realized by using standard visible wavelength of camera system.